2014 Student Research Conference:
27th Annual Student Research Conference

Atomic Force Microscope at Truman State University
Matthew R. Evers
Dr. Mohammad Samiullah, Faculty Mentor

The Atomic Force Microscope is an apparatus designed to observe the topological atomic structure. The device gives a 3D image rather than a two dimensional image from other microscopes designed to observe the same structures such as an electron microscope. The AFM measures the force exerted by inter-atomic interactions between the AFM's probe and the surface of the structure. The force is measured by the deflection of a cantilever that behaves as a spring. The deflection yields a voltage change that results from a laser reflected off the cantilever incident on a quadrant photodiode. The forces prevalent in this interaction are the Van der Waals forces. As the cantilever approaches the atomic surface, the lever will undergo and attractive and then repulsive regime indicative of the Van der Waals forces. This force behavior was observed with our apparatus.

Keywords: Atomic Force Microscope , Van der Waals Interactions


Presentation Type: Poster

Session: 13-1
Location: GEO - SUB
Time: 3:30

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